A El-Hdiy: search on Z-Library

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1

The positive charge neutralisation after bi-directional stress on MOS capacitors

D Ziane, A El-Hdiy

Journal:

Microelectronics Reliability

Year:

2000

Language:

english

File:

PDF, 132 KB

english, 2000

2

Stress field polarity effect on defects generation in thin silicon dioxide films

A. El-Hdiy, G. Salace, M. Jourdain, A. Meinertzhagen, D. Vuillaume

Journal:

Thin Solid Films

Year:

1997

Language:

english

File:

PDF, 337 KB

english, 1997

3

Comparison of the generated oxide charge by injection of electrons for both polarities

A. Meinertzhagen, G. Yard, C. Petit, M. Jourdain, A. El-Hdiy, G. Salace, G. Reimbold

Journal:

Journal of Non-Crystalline Solids

Year:

1995

Language:

english

File:

PDF, 314 KB

english, 1995

4

The no-thermal activation of the defect generation mechanism in a MOS structure

A. El-Hdiy, G. Salace, A. Meinertzhagen, M. Jourdain, C. Petit, A. Aassime

Journal:

Journal of Non-Crystalline Solids

Year:

1995

Language:

english

File:

PDF, 246 KB

english, 1995

5

Study of defects induced by high-electric-field stress into a thin gate oxide (11 nm) of metal-oxide-semiconductor capacitors

A. El-hdiy, G. Salace, C. Petit, M. Jourdain, D. Vuillaume

Year:

1993

Language:

english

File:

PDF, 1.00 MB

english, 1993

6

Relaxation of positive charge during bidirectional electric stress on metal–oxide–silicon capacitors

El-Hdiy, A., Ziane, Dj

Journal:

Journal of Applied Physics

Year:

1999

Language:

english

File:

PDF, 292 KB

english, 1999

7

Study of the interface-state formation at different temperatures

Year:

1993

Language:

english

File:

PDF, 561 KB

english, 1993

8

Positive charge and interface state generation in a thin gate oxide (30 nm) metal-oxide-semiconductor capacitor

El-Hdiy, Abdelillah

Journal:

Journal of Applied Physics

Year:

1994

Language:

english

File:

PDF, 1.07 MB

english, 1994

9

Bidirectional stress on a p-metal–oxide–silicon capacitor

Ziane, Dj., El-Hdiy, A., Salace, G.

Journal:

Journal of Applied Physics

Year:

1999

Language:

english

File:

PDF, 358 KB

english, 1999

10

Positive charge instability during bidirectional stress on metal–oxide–silicon capacitors

Ziane, Dj., El-Hdiy, A.

Journal:

Journal of Applied Physics

Year:

2000

Language:

english

File:

PDF, 341 KB

english, 2000

11

Electric bidirectional stress effects on metal–oxide–silicon capacitors

El-Hdiy, A., Ziane, Dj.

Journal:

Journal of Applied Physics

Year:

2001

Language:

english

File:

PDF, 331 KB

english, 2001

12

Generation of Si–SiO2 interface states by high electric field stress from low (100 K) to high (450 K) temperatures

Vuillaume, Dominique, Mir, Abdellah, Bouchakour, Rachid, Jourdain, Marc, El-Hdiy, Abdelillah, Salace, Guy

Journal:

Journal of Applied Physics

Year:

1993

Language:

english

File:

PDF, 1.75 MB

english, 1993

13

Dependence of interface-state generation on field polarity in metal-oxide-silicon devices of various thicknesses and technologies

A. El-hdiy, D. Ziane, F. Nebel, D. Vuillaume, M. Jourdain

Year:

1999

Language:

english

File:

PDF, 210 KB

english, 1999

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